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Proceedings Paper

Virtual orthogonal grid method for calibrating structured light binocular vision measurement system
Author(s): Qiang Dai; Tao Geng; Hu Deng; Wei-he Ren; Jia-jie Liu
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Paper Abstract

In order to calibrate structured light depth image object surface profile measurement binocular vision system, a calibration mathematical model and calculation method is given. Special gauge head is fixed on precision automatic platform, and then moved by standard space length in two-dimension measured section. Every orthogonal point's gauge head image is collected by subsystem. All orthogonal point coordinate values form a virtual grid field. The whole measurement section is divided into standard square region. From system coordinate transformation, the orthogonal point coordinate values in subsystem are one-to-one correspondence with real object coordinate values in the binocular vision measurement system. In every standard square region, the real object coordinate values are calculated and calibrated by segment linear interpolation. Detailed calibration algorithm principle and error analysis are given. The results show that a group of orthogonal grid point can calibrate the whole system measurement section. The systematic measurement errors are less than 0.15 mm within 100mm depth measurement range.

Paper Details

Date Published: 27 November 2007
PDF: 5 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672349 (27 November 2007); doi: 10.1117/12.783625
Show Author Affiliations
Qiang Dai, Harbin Engineering Univ. (China)
Tao Geng, Harbin Engineering Univ. (China)
Hu Deng, Harbin Engineering Univ. (China)
Wei-he Ren, Harbin Engineering Univ. (China)
Jia-jie Liu, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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