Share Email Print
cover

Proceedings Paper

Sensitivity of magneto-optic method for measuring beat-length of high birefringence optical fiber
Author(s): Huan-Huan Bao; Zhi-Dong Shi; Jian-Qiang Lin; Shu Liu; Xue-Nong Xiang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Examined is the influence by input state of polarization and analyzing scheme on sensitivity in the measurement system of beat length that relies on magneto-optic modulation technique in which the magnetic gap and intensity of magnetic field have been given. Through theoretic analysis and experimental study, it is found that there are three experiment schemes getting maximum sensitivity. First, the polarization direction of the input linearly polarized light is at θ = 00 or 900 to the birefringence fast axis of e fiber, at the same time, the two analyzing axes of Wollaston prism are at γ = 450 to the birefringence fast or slow axis of fiber. Second, the polarization direction of input linearly polarized light is at θ = 450, and γ = 00 or 900. Third, the input light beam is circular polarized light, at the same time, γ = 00 or 900. The sensitivity under three cases is approximately equal, but the third scheme needn't pinpoint the direction of birefringence axis of fiber, which makes the experiment more convenient and avoid the measurement error caused by the adjustment of angle.

Paper Details

Date Published: 17 January 2008
PDF: 7 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672340 (17 January 2008); doi: 10.1117/12.783584
Show Author Affiliations
Huan-Huan Bao, Shanghai Univ. (China)
Zhi-Dong Shi, Shanghai Univ. (China)
Jian-Qiang Lin, Guangxi Institute of Technology (China)
Shu Liu, Shanghai Univ. (China)
Xue-Nong Xiang, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top