Share Email Print
cover

Proceedings Paper

STABCC: a new 3D surface topography algorithm based on contourlet transform and correlation theory
Author(s): Jun Wang; Yan Kang; Lijun Xu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In machining and testing fields, 3-D surface topography evaluation is always one of the hottest study issues. Especially, in advanced integrate circuit and nanometer manufacture techniques where surface spraying and thin film plating are commonly applied for, anisotropy behavior in surface topography is rather obvious and existent 3-D surface topography evaluation is not enough in expressive force. Based on the discussing about that the advantages and disadvantages of all existent filtering methods. The contourlet Transform (CT) which may provide tight bracing and mutliscale analysis was introduced. And a new 3-D surface topography evaluation filtering algorithm is presented. This algorithm has some excellent performances such as multiscale analysis, time-frequency-localization and multidirections. Especially, the algorithm is good at describing high dimensions data. Meanwhile, on the assumption that noise comply with Gaussian distributing, according to the theory that noise is not correlated with signal, STABCC that depress noise was designed. The surface topography of a part was measured with WIVES. The data of measurement was processed by STABCC. Experiment result indicates that STABCC can reliably obtain benchmark of evaluation. And the surface information of measured part can be extracted and analyzed without distortion. Comparing with existent 3-D surface topography evaluation methods, STABCC is preponderant in practicality of engineering surface evaluation.

Paper Details

Date Published: 14 November 2007
PDF: 6 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67223I (14 November 2007); doi: 10.1117/12.783544
Show Author Affiliations
Jun Wang, Huazhong Univ. of Science and Technology (China)
China Jiliang Univ. (China)
Yan Kang, House Mapping and Conveying Institute of Zhe Jiang (China)
Lijun Xu, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

© SPIE. Terms of Use
Back to Top