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Proceedings Paper

Study on the performance of organic light-emitting diode with N,N'-bis(3-methylphenyl)-N,N'-diphenylbenzidine doped in polystyrene as hole transporting layer
Author(s): Jing Deng; Guangzhong Xie; Junsheng Yu; Fan Suo; Weizhi Li; Yadong Jiang
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Paper Abstract

Organic light-emitting diodes (OLEDs) with a structure of indium-tin-oxide(ITO)/N,N'-bis(3-methyl¬phenyl)-N,N'-diphenylbenzidine(TPD):polystyrene(PS)/tris(8-hydroxyquinoline)-aluminum(Alq3)/Mg:Ag were fabricated. Among them PS:TPD thin film acts as a hole transporting layer (HTL) and was prepared via dimethylbenzene solution dissolved with a mixture of PS:TPD by spin-coating method. The influence of TPD doped ratio in the mixture on the performance of device was investigated. Experimental results show that luminescent brightness of devices increase with the enhancement of TPD doped ratio, while electroluminescent spectra are not affected. In addition, lifetime of the device when the ratio of TPD to PS is 7:3 was 4 times higher than that of pure-TPD device. This phenomenon was postulated that PS enhanced the uniformity of TPD film, which was characterized by the result of atomic force microscope (AFM) analysis, and thus overcame the shortcoming of low stability of small-molecular film.

Paper Details

Date Published: 14 November 2007
PDF: 4 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67223P (14 November 2007); doi: 10.1117/12.783538
Show Author Affiliations
Jing Deng, Univ. of Electronic Science and Technology of China (China)
Guangzhong Xie, Univ. of Electronic Science and Technology of China (China)
Junsheng Yu, Univ. of Electronic Science and Technology of China (China)
Fan Suo, Univ. of Electronic Science and Technology of China (China)
Weizhi Li, Univ. of Electronic Science and Technology of China (China)
Yadong Jiang, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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