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Proceedings Paper

NETD test of high-sensitivity infrared camera
Author(s): Yingwen Li; Debin Pan; Changcheng Yang; Yan Luo
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Paper Abstract

Infrared camera has more and more application in military, judicature, rescue, industry, hospital and science. Nowadays the NETD (Noise Equivalent Temperature Difference) of high-sensitivity cooled infrared camera is less than 10 mK. If we test the NETD from the analog video output port of infrared camera using 8-bit and 10-bit ADC frame grabber, the NETD accuracy is 7.81 mK and 2.76 mK which correspond to relative error 78.7% and 27.6% for a 10 mK NETD infrared camera. Such kind of accuracy is obviously not proper for the performance evaluation of high-sensitivity infrared camera with NETD less than 10 mK. The NETD test accuracy can be improved by increasing the effective bit number of the ADC of frame grabber. The quantization error of ADC of frame grabber has become the main factor which contributes most to the NETD error of the high-sensitivity infrared camera. It is difficult to evaluate the electrooptical performance of the high-sensitivity infrared camera through its analog video. Although the NETD test accuracy can be improved by reducing the linear temperature range or increasing the effective bits of the ADC of frame grabber under analog video interface test condition, it is difficult to meet the test needs. But under the 14 bits digital video interface test condition and 1 K linear range, the NETD test accuracy of 0.24 mK can be achieved. The NETD accuracy can be also improved by reducing the linear temperature range. The NETD test accuracy can be 0.488 mK through 14-bit digital video under 2 K linear temperature range and its relative error equals 4.9% for a 10 mK NETD high-sensitivity infrared camera which meets the requirement. The test result through the digital video port of an infrared camera shows that the test result through digital video port matches with its nominal value. This necessitates the need of digital video interface of high-sensitivity infrared camera in NETD test in order to evaluate its performance accuracy.

Paper Details

Date Published: 27 November 2007
PDF: 5 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67233Q (27 November 2007); doi: 10.1117/12.783521
Show Author Affiliations
Yingwen Li, Huazhong Institute of Electro-Optics (China)
Debin Pan, Huazhong Institute of Electro-Optics (China)
Changcheng Yang, Huazhong Institute of Electro-Optics (China)
Yan Luo, Huazhong Institute of Electro-Optics (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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