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Proceedings Paper

Laser writing system for test of large aspheric surfaces
Author(s): Hyug-Gyo Rhee; Jae-Bong Song; Dong-Ik Kim; Kwan-Soo Ha; Seung-Ki Hong; Yun-Woo Lee; In-Won Lee; Jae-Heung Jo
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Paper Abstract

KRISS Space Optics Research Center has tested large aspheric surfaces by using interferometry and a series of computer-generated hologram (CGH). In this case it is necessary to fabricate various CGHs in the laboratory level. To address this purpose we are developing and improving a simple and precise laser writing system which uses a cylindrical or circular coordinate. In our system 300 mm diameter CGH can be fabricated with 0.8 μm spatial resolution in radial direction. The writing source Ar+ laser is stabilized by intensity feedback, and gives us approximately 800 mW after the stabilization process at 457.9 nm wavelength. The stabilized beam power is controlled again to make 256 different intensity levels. We also used an auto-focusing technique with astigmatic lenses for the purpose of focusing the writing beam on the material surface.

Paper Details

Date Published: 17 January 2008
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67233F (17 January 2008); doi: 10.1117/12.783504
Show Author Affiliations
Hyug-Gyo Rhee, Korea Research Institute of Standards and Science (South Korea)
Jae-Bong Song, Korea Research Institute of Standards and Science (South Korea)
Dong-Ik Kim, Korea Research Institute of Standards and Science (South Korea)
Kwan-Soo Ha, Hannam Univ. (South Korea)
Seung-Ki Hong, Hannam Univ. (South Korea)
Yun-Woo Lee, Korea Research Institute of Standards and Science (South Korea)
In-Won Lee, Korea Research Institute of Standards and Science (South Korea)
Jae-Heung Jo, Hannam Univ. (South Korea)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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