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Proceedings Paper

Imaging resolution of digital holographic microscopy with premagnification
Author(s): Huaying Wang; Guangjun Wang; Jie Zhao; Dayong Wang
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Paper Abstract

The pre-magnification digital holography with a microscopic objective (MO) has become an important mean for imaging and measuring of microscopic objects. Based on Fresnel diffraction theory, the point spread function of digital off-axis Fresnel holographic system with pre-magnification is firstly deduced in detail. The lateral resolution of this imaging system is then analyzed. The amplitude distributions of the point spread functions of the MO, the holographic CCD and the whole imaging system are simulated respectively. Then, the matching requirements between MO and the holographic CCD are discussed. Some ambiguities about the resolution limitation in existing literatures are clarified. The results show that only when the image resolution of the holographic CCD is not below the imaging resolution of the MO, the resolution of overall system is dependent on the numerical aperture of the MO. Otherwise, it is dependent on the numerical aperture of the CCD. It is optimum to make the imaging resolution of the MO approach its limitation and be equal to or less than the resolution of the holographic CCD a little. The simulation results verify the validities of the theoretical analysis.

Paper Details

Date Published: 27 November 2007
PDF: 7 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67233D (27 November 2007); doi: 10.1117/12.783499
Show Author Affiliations
Huaying Wang, Beijing Univ. of Technology (China)
Hebei Univ. of Engineering (China)
Guangjun Wang, Beijing Univ. of Technology (China)
Henan Institute of Metrology (China)
Jie Zhao, Beijing Univ. of Technology (China)
Dayong Wang, Beijing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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