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Proceedings Paper • Open Access

Research on a real-time scanning tunneling microscope data acquisition system (Notice of Removal)
Author(s): Chang Xu; Baoping Xiao; Lijun Xu

Paper Abstract

This paper (67233A) was removed from the SPIE Digital Library on 13 April 2010 to discovery of plagiarism. As stated in the SPIE Guidelines for Professional Conduct and Publishing Ethics, SPIE defines plagiarism as the reuse of someone else's prior ideas, processes, results, or words without explicit attribution of the original author and source, or falsely representing someone else's work as one's own. SPIE considers plagiarism in any form, at any level, to be unacceptable and a serious breach of professional conduct. It is SPIE policy to remove such papers and to take appropriate corrective or disciplinary action against the offending author(s).

Paper Details

Date Published: 17 January 2008
PDF: 1 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67233A (17 January 2008); doi: 10.1117/12.783484
Show Author Affiliations
Chang Xu, China Jiliang Univ. (China)
Baoping Xiao, China Jiliang Univ. (China)
Zhejiang Univ. (China)
Lijun Xu, China Jiliang Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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