Share Email Print

Proceedings Paper

DUV phase mask for 100 nm period grating printing
Author(s): Y. Jourlin; Y. Bourgin; S. Reynaud; O. Parriaux; A. Talneau; P. Karvinen; N. Passilly; A. Md. Zain; R. M. De La Rue
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Whereas microelectronic lithography is heading to the 32 nm node and discussing immersion and double-patterning strategies, there is much which can be done with the 45 nm node in microoptics for white light processing. For instance, one of the most demanding applications in terms of achievable period is the LCD lossless polarizer, which can transmit the TM polarization and reflect the TE polarization evenly all through the visible spectrum - provided that a 1D metal grid of 100 nm period can be fabricated. The manufacture of such polarizing panels cannot resort to the step & repeat cameras of microelectronics since the substrates are too large, too thin, too wavy and full of contaminants. There is therefore a need for specific fabrication techniques. It is one of these techniques that a subgroup of partners belonging to two of the Networks of Excellence of the European Community, NEMO and ePIXnet, have decided to explore together.

Paper Details

Date Published: 14 May 2008
PDF: 9 pages
Proc. SPIE 6992, Micro-Optics 2008, 69920C (14 May 2008); doi: 10.1117/12.783390
Show Author Affiliations
Y. Jourlin, Lab. Hubert Curien, Univ. Jean Monnet (France)
Y. Bourgin, Lab. Hubert Curien, Univ. Jean Monnet (France)
S. Reynaud, Lab. Hubert Curien, Univ. Jean Monnet (France)
O. Parriaux, Lab. Hubert Curien, Univ. Jean Monnet (France)
A. Talneau, Lab. de Photonique et des Nanostructures (France)
P. Karvinen, Univ. of Joensuu (Finland)
N. Passilly, Univ. of Joensuu (Finland)
A. Md. Zain, Univ. of Glasgow (United Kingdom)
R. M. De La Rue, Univ. of Glasgow (United Kingdom)

Published in SPIE Proceedings Vol. 6992:
Micro-Optics 2008
Hugo Thienpont; Peter Van Daele; Jürgen Mohr; Mohammad R. Taghizadeh, Editor(s)

© SPIE. Terms of Use
Back to Top