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Proceedings Paper

Approach using sparse bundle adjustment for system calibration of fringe projective 3D profile sensor
Author(s): Jian Luo; Jiahu Yuan; Jinling Chen; Ai Xiong
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Paper Abstract

A new model-based system calibration approach to achieve optimal parameters of fringe projective 3D profile sensor is proposed, by modeling the projector as an inverse camera. The whole calibration procedure is divided into two steps: camera calibration and projector calibration. Jointly considering the relations among cameras and projector, a method of bundle adjustment suitable for the system is described. Not only the feature parameters described as homologous pairs of corresponding image points, but also the intrinsic parameters of projector and cameras shared by all views are considered for constructing the cost function. The lack of interaction among parameters for different features in multiple views results in underlying normal equations exhibiting a sparse block structure, which is exploited to obtain considerable computational benefits. The sparse Levenberg-Marquardt method is used as the last minimization means of bundle adjustment. Experiments are carried out for testing the convergence, efficiency and accuracy of the approach. The results show that within reasonable confidence interval the calibration accuracy is higher than that of the linear method. Even with the loss of feature information, the approach still works well and the results remain nearly the same.

Paper Details

Date Published: 27 November 2007
PDF: 11 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672331 (27 November 2007); doi: 10.1117/12.783382
Show Author Affiliations
Jian Luo, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Jiahu Yuan, Institute of Optics and Electronics (China)
Jinling Chen, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Ai Xiong, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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