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Proceedings Paper

Morphology of femtosecond laser-induced structural changes in MgAl2O4 crystal
Author(s): Ben-Hai Yu; Neng-Li Dai; Yu-Hua Li; Qi-Guang Zheng; Pei-Xiang Lu
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Paper Abstract

The morphology of structural changes in MgAl2O4 transparent ceramic (MATC) crystal ablated by femtosecond laser pulse has been investigated. Experiments were performed using a commercial Ti:sapphire laser system with 800 nm/50 fs and the repetition ratio of 1 kHz. The damage threshold and ablation area for MgAl2O4 transparent ceramic are investigated. The result shows that the darkening threshold and the damage threshold of MATC are measured to be 6.0×1012 W/cm2 and 2.4×1013 W/cm2, respectively. The ablated spots are examined by means of a charge coupled device (CCD) camera, scanning electron microscopy (SEM) and atom force microscopy (AFM). The infrared transmission ratio (IR transmission ratio) properties of MATC crystal ablated by femtosecond laser pulse are measured by micro-IR spectra. The result shows that the damaged area will increase linearly with the increasing energy of single pulse while will be approximate satisfied with Boltzmann distribution with the increasing number of multiple pulses. The spot ablated at optimized energy pulses (near the damage threshold energy) can improve the IR transmission ratio of MATC crystal from 82% to 86%. Furthermore, the periodic ripples about 100 nm in width and 200 nm in neighbouring ripples distance are formed on the bottom surfaces of ablation holes.

Paper Details

Date Published: 14 November 2007
PDF: 7 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672232 (14 November 2007); doi: 10.1117/12.783369
Show Author Affiliations
Ben-Hai Yu, Xinyang Normal Univ. (China)
Huazhong Univ. of Science and Technology (China)
Neng-Li Dai, Xinyang Normal Univ. (China)
Yu-Hua Li, Xinyang Normal Univ. (China)
Qi-Guang Zheng, Xinyang Normal Univ. (China)
Pei-Xiang Lu, Xinyang Normal Univ. (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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