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Proceedings Paper

Calculation and analysis of the measurement of the focal length of a lens in a Fizeau interferometer with combination lenses
Author(s): Jing Yuan; Huan Ren; Bo Chen; Hua Xu; Yi Yang; Xiaoqing Tang; Yurong Ma; Ke Ma; Deqiang Yu; Wenhong Li; Wanguo Zheng
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Paper Abstract

In this paper, the measurement method of long focal length in a Fizeau interferometer with combination lenses is stated. According to the principle of geometry optics, two focal length calculation formulae are deduced for the measurement method. The optimization of measurement parameter values is analyzed, and the optimized values of measurement parameters are selected. By analyzing the measurement error of the focal length needed to be measured, the permitted error ranges of measurement parameters are obtained for the optimization of parameters so as to meet the requirement of measurement accuracy of focal length (±0.1%). By means of analysis, it is obtained that the measurement method can meet the requirement (±0.1%) of measurement accuracy of long focal length of high power laser Facility.

Paper Details

Date Published: 27 November 2007
PDF: 8 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232Y (27 November 2007); doi: 10.1117/12.783365
Show Author Affiliations
Jing Yuan, Laser Fusion Research Ctr., CAEP (China)
Huan Ren, Laser Fusion Research Ctr., CAEP (China)
Bo Chen, Laser Fusion Research Ctr., CAEP (China)
Hua Xu, Laser Fusion Research Ctr., CAEP (China)
Yi Yang, Laser Fusion Research Ctr., CAEP (China)
Xiaoqing Tang, Laser Fusion Research Ctr., CAEP (China)
Yurong Ma, Laser Fusion Research Ctr., CAEP (China)
Ke Ma, Laser Fusion Research Ctr., CAEP (China)
Deqiang Yu, Laser Fusion Research Ctr., CAEP (China)
Wenhong Li, Laser Fusion Research Ctr., CAEP (China)
Wanguo Zheng, Laser Fusion Research Ctr., CAEP (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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