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Proceedings Paper

New calibration approach for light stripe sensor
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Paper Abstract

A simple, flexible and real-time calibration method is proposed to solve the calibrating problems of line structure light sensor such as requirement of high accurate calibration model, complicated calibrating procedure and so on. First, a 2D calibration plane with tessellated pattern is placed at several arbitrary places in the measurement range of sensor, and the pictures of calibration board on these positions are recoded. The parameters of camera are estimated from these pictures. Secondly, the line structure light is turned on, and projected on the surface of calibration board. Several pictures are captured while the board is being moved along the direction of line structure light. Thirdly, the rotating matrixes and transform vectors between the local coordinates of these planes and the global coordinate of sensor are estimated. The global coordinates of the control points falling on the line structure light plane were calculated according to these matrixes and vectors. Finally, the model parameters of the sensor at working state are optimized with these control points. The cost of calibration equipment is greatly reduced and the calibrating procedure is simplified with the proposed approach. So it can promote the engineering applications of the line structure light sensor. It shows that this method is practical for surface measurement. The height error (RMS) of the measured object reaches 0.03mm in the region of 200mm x 150mm.

Paper Details

Date Published: 27 November 2007
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232W (27 November 2007); doi: 10.1117/12.783360
Show Author Affiliations
Qingyang Wu, Shenzhen Univ. (China)
Xianyu Su, Sichuan Univ. (China)
Bin Hui, Shenzhen Univ. (China)
Jingzhen Li, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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