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Proceedings Paper

Negative refraction phenomenon dependent on wave guide width
Author(s): Li Feng; Binming Liang; Zhuo Li; Jiabi Chen; Songlin Zhuang
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Paper Abstract

Many changes of various parameters in photonic crystal cause changes of band structure and thus cause changes of light propagation through photonic crystal. The paper is mainly concerned with the study of negative refraction phenomenon dependent on wave guide width in 2D photonic crystal which consists of a hexagonal lattice of circular dielectric rods with Si. It is separately carried on the elaboration from three aspects: along with the accretion of wave guide width in photonic crystal, how the incident light frequency range in which the negative refraction phenomenon presents is changed; under identical incident light frequency, if the negative refraction phenomenon presents, then what the transformation of corresponding negative refractive index is ; if the value of refractive index of -1 is obtained, what the trend of e incident light frequency is.

Paper Details

Date Published: 14 November 2007
PDF: 6 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67222Z (14 November 2007); doi: 10.1117/12.783351
Show Author Affiliations
Li Feng, Univ. of Shanghai for Science and Technology (China)
Binming Liang, Univ. of Shanghai for Science and Technology (China)
Zhuo Li, Univ. of Shanghai for Science and Technology (China)
Jiabi Chen, Univ. of Shanghai for Science and Technology (China)
Songlin Zhuang, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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