Share Email Print
cover

Proceedings Paper

Study on ITO/Ag/ITO multilayer film as the electrode of organic light-emitting diodes
Author(s): Lei Zhang; Jun-sheng Yu; Jian Zhong; Hong Wang; Ya-dong Jiang; Jian-fang Deng
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

ITO (Indium tin oxide) film has been widely used as transparent electrode for organic light-emitting diodes (OLEDs). Higher conductibility and transparency, smoother surface morphology and higher work function are indispensable for the fabrication of high performance OLEDs, especially for transparent and double-side devices. Therefore, it is necessary to deposit ITO films at low temperature to protect the organic films of OLED from damaging during fabrication process. In this work a novel transparent electrode ITO/Ag/ITO was introduced to the OLED device. This kind of transparent electrode was used to reduce the sheet resistance of electrode and raise the performance of OLED device. By theoretical simulation, the optimum film thickness of three organic layers was obtained. ITO and Ag films were prepared by DC magnetron sputtering at room temperature. The transparent electrode with low sheet resistance of 6.3 Ω/sq and high transmittance of 87% at 550 nm was achieved. OLED consisted of this multilayer film was developed. The relationship between the thickness of Ag film and photoelectric performance of multilayer films was also discussed.

Paper Details

Date Published: 16 November 2007
PDF: 5 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67222Q (16 November 2007); doi: 10.1117/12.783346
Show Author Affiliations
Lei Zhang, Univ. of Electronic Science and Technology of China (China)
Jun-sheng Yu, Univ. of Electronic Science and Technology of China (China)
Jian Zhong, Univ. of Electronic Science and Technology of China (China)
Hong Wang, Univ. of Electronic Science and Technology of China (China)
Ya-dong Jiang, Univ. of Electronic Science and Technology of China (China)
Jian-fang Deng, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

© SPIE. Terms of Use
Back to Top