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Proceedings Paper

High resolution test for large optics with sub-pixel phase retrieval method
Author(s): Xiaojun Hu; Shengyi Li; Yulie Wu
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Paper Abstract

For large mirror test, there is growing need to increase the spatial resolution of the test instrument, when testing large optics. A novel test method is introduced to achieve high spatial resolution based on phase retrieval method that splits each pixel of CCD into sub-pixels by numeric processing. Because the more images are captured, the more information of wave front is gathered to confirm the state of each sub-pixel, the sub-pixel phase retrieval needs multi-images and also more calculation power to process these images. Numerical experiments shows that more than 4 times of resolution of traditional phase retrieval method can be achieved by this method.

Paper Details

Date Published: 27 November 2007
PDF: 7 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232C (27 November 2007); doi: 10.1117/12.783297
Show Author Affiliations
Xiaojun Hu, National Univ. of Defense Technology (China)
Shengyi Li, National Univ. of Defense Technology (China)
Yulie Wu, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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