Share Email Print
cover

Proceedings Paper

Research on 3-D device for infrared temperature detection
Author(s): Shuxin Chen; Shaohua Jiang; Jie Hou; Shuwang Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In a certain field, it is important to measure temperature information in variable direction at the same time. However, there are few instruments to accomplish the function now. To implement the measure in 3 dimensions, an experimental table of temperature detection by infrared is designed. It is the integration of detection, control and monitor. The infrared device in the table can detect and measure temperature in real time, and the three dimension electric motional device can adjust the detection distance by the user. The mechanical bar for displacement is controlled by a circuit with the control button. The infrared temperature sensor is fixed on the bar, so it can move along with the bar controlled by the circuit. The method of temperature detection is untouched, so it can detect small object and its tiny variable temperature, which can not be detected by the thermometer or the electronic temperature sensor. In terms of the 3-D parallel motion control, the device can implement temperature measurement in variable directions. According to the results of the temperature values, the 3-D temperature distributed curve can be described. By using of the detection device, temperature of some special objects can be detected, such as the live anatomical animal, small sensor, nondestructive object, and so on.

Paper Details

Date Published: 17 January 2008
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67231S (17 January 2008); doi: 10.1117/12.783205
Show Author Affiliations
Shuxin Chen, Hebei Univ. of Science and Technology (China)
Shaohua Jiang, Hebei Univ. of Science and Technology (China)
Jie Hou, Hebei Univ. of Science and Technology (China)
Shuwang Chen, Hebei Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top