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Proceedings Paper

Design of new-style integrated verification device for optical theodolites
Author(s): Xiaosong Guo; Zhi Zhu; Haicheng Wu; Lipei Ding
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Paper Abstract

The configuration and function of the device have been described in detail. Using the device, we can verify all the main performance parameters of existing optical theodolites. We solve the problem of small-angle measurement by using one linear CCD. To overcome the inherent limitation imposed by CCD pixels to measurement precision, we proposed a subdivision method of interpolating edge pulse. By using this method, the ultimate error can be controlled within 0.5". We also proposed a novel "N" reticule. The reticule cooperates with linear CCD can easily accomplish two dimensional synchronous measurement of the angular deviation. For improving reading precision, we applied some image recognition techniques such as image enhancement, practical entropy threshold setting and sifting-continuity matching. The reading precision has been increased to 1". The measurement uncertainties have been evaluated at the end of the paper. The results show that the uncertainty indexes of the device can fully meet the requirements of verification work. The device has the advantages of small volume, high automation, convenient operation and good reading repeatability. It has been used in many measurement stations successfully.

Paper Details

Date Published: 27 November 2007
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67231L (27 November 2007); doi: 10.1117/12.783186
Show Author Affiliations
Xiaosong Guo, Xi’an Research Institute of High-tech (China)
Zhi Zhu, Xi’an Research Institute of High-tech (China)
Haicheng Wu, Xi’an Research Institute of High-tech (China)
Lipei Ding, Xi’an Research Institute of High-tech (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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