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Proceedings Paper

Rotating sensing based on slow light coupled resonator structure with EIT-like property
Author(s): Chao Peng; Zhengbin Li; Anshi Xu
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Paper Abstract

We discuss the relationship between Sagnac effect and "slow light" phenomenon, and point out that although the medium and waveguide dispersion can in no way affect the magnitude of Sagnac effect, the highly dispersive structure is still beneficial to the enhancement of Sagnac effect and can be utilized to detect absolute rotation for navigation purpose. Based on the EIT-like property of coupled resonator structure, a miniature highly sensitive gyroscope is possible. This EIT-like phenomenon occurs through a classical mean in a coupled resonator structure due to all-optical classical interference, called coupled resonator induced transparency (CRIT). With the analogy between optical and atomic parameters, we treat Sagnac effect as a phase perturbation to resonators' optical parameters, and then analyze Sagnac effect in a CRIT structure with a transfer function approach and derive the explicit expression of relative Sagnac phase shift. We find that Sagnac effect is enhanced as a factor as light slows, and can be tailored by adjusting the optical parameters of structure. Furthermore, as a potential highly sensitive, compact size rotation sensor, some issues for the implementation of CRIT structure based gyroscope are discussed and considered, such as the fabrication possibility, line-width, shot noise limit sensitivity and integration issues. With the improvement of micro-fabrication technique, this gyroscope should have all-solid configuration, compact size and also be expected to achieve comparable sensitivity to common optic-fiber gyroscope. It would be easily integrated to all-optical application and construct a high performance rotation sensor.

Paper Details

Date Published: 14 November 2007
PDF: 5 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67222F (14 November 2007); doi: 10.1117/12.783148
Show Author Affiliations
Chao Peng, Peking Univ. (China)
Zhengbin Li, Peking Univ. (China)
Anshi Xu, Peking Univ. (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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