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Proceedings Paper

Optical and morphological characteristics of organic thin films for optoelectronic devices
Author(s): Zhiyou Zhong; Fenglou Sun
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Paper Abstract

Organic semiconductor thin films of tri-(8-hydroxyquinoline)-aluminum (Alq), 9,10-di-(2-naphthyl)-anthracene (ADN), and N,N'bis(naphthalen-1-yl)-N,N'bis(phenyl)-benzidine (NPB) for optoelectronic devices were deposited onto glass substrates by vacuum sublimation technique. The surface morphology and roughness of the thin film were characterized by means of atomic force microscopy (AFM). Experimental results indicate that all thin films present similar granular topography but different surface roughness. In addition, the optical transmittance spectra of thin films were measured by a double beam spectrophotometer and their corresponding optical properties were investigated. The complex refractive index and the optical band gap of thin films were obtained, respectively. Meanwhile, the dispersion behavior of the refractive index was studied in terms of Wemple-DiDomenico single oscillator model, and the oscillator parameters were achieved.

Paper Details

Date Published: 27 November 2007
PDF: 8 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67231A (27 November 2007); doi: 10.1117/12.783144
Show Author Affiliations
Zhiyou Zhong, South-Central Univ. for Nationalities (China)
Fenglou Sun, South-Central Univ. for Nationalities (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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