Share Email Print
cover

Proceedings Paper

Instrument for testing the near and far field distribution of semiconductor laser
Author(s): Xiaoguang Jiang; Cun Zhuang; Yingjie Zhao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

To visually check out the semiconductor laser emitting, especially in judging Fabry-Perot (F-P) equivalent cavity faces near field luminescence condition and distant field giving out light condition, a test device is designed. By applying the simple component and principle, this device can realize the observation to glowing faculae of semiconductor laser, thus knowing the laser's properties such as optical density distribution, half power angle, angle of divergence, also discovering the concave wiring, the dark spot by observing the Fabry-Perot (F-P) equivalent cavity faces near field luminescence condition and distant field giving out light condition. It is a kind of good method for analyzing the situation of the active area cavity faces cauterization damage and internal structure flaws. So this device is suitable for teaching demonstration and direct observation of laser quality in manufacturing. It is also suitable for array laser chip testing, such as to see if chip gives out light, and to see the glowing intensity directly.

Paper Details

Date Published: 27 November 2007
PDF: 4 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672318 (27 November 2007); doi: 10.1117/12.783142
Show Author Affiliations
Xiaoguang Jiang, Chang Chun Science and Technology Univ. (China)
Cun Zhuang, Chang Chun Science and Technology Univ. (China)
Yingjie Zhao, Chang Chun Science and Technology Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top