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Proceedings Paper

Numerical simulation of rough surface bidirectional reflectance distribution function (BRDF)
Author(s): Weiwei Feng; Qingnong Wei; Shimei Wang; Yunzhi Wu; Shisheng Liu; Dexia Wu; Zengdong Liu
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Paper Abstract

Bidirectional Reflectance Distribution Function (BRDF ) has a wide use in surface detection and target recognition in the surveillance system. There are many existing models used to validate experimental data and to represent the surface. In order to make clearly the similarities and difference between the existing models, numerical simulation of several kind of models were done, and the comparison and analysis between were made. To fit practicale application, a kind of new model based on micro-facet theory was proposed. This model has both diffuse and specular components, which take into account the geometrical effects such as masking and shadowing. The numerical simulation results are compared with the experimental data obtained from a three-axis goniometer system on some typical materials. The comparison indicates that this model fits well with experimental data and can satisfy practical use in a project.

Paper Details

Date Published: 27 November 2007
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672314 (27 November 2007); doi: 10.1117/12.783128
Show Author Affiliations
Weiwei Feng, Anhui Institute of Optics and Fine Mechanics (China)
Qingnong Wei, Anhui Institute of Optics and Fine Mechanics (China)
Shimei Wang, Anhui Institute of Optics and Fine Mechanics (China)
Yunzhi Wu, Anhui Institute of Optics and Fine Mechanics (China)
Shisheng Liu, Anhui Institute of Optics and Fine Mechanics (China)
Dexia Wu, Anhui Institute of Optics and Fine Mechanics (China)
Zengdong Liu, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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