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Proceedings Paper

Method for characterization and simulation of non-axisymmetric aspheric rough surface
Author(s): Y. F. Peng; Y. B. Guo
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Paper Abstract

This paper presents a method for characterization and simulation of the non-axisymmetric aspheric rough surface. With this characterization procedure, simulation of the rough surface is simplified by decomposing the rough surface into two parts, which are the non-axisymmetric aspheric surface and the only rough component without the ideal surface. Then each component of the divided surface is simulated individually. The rough surface exhibits self-affinity and the fractal number D can be associated with any profile and is scale-invariant, and then the rough surface component is simulated with the Weierstrass-Mandelbrot fractal function. An example for simulating a non-axisymmetric and aspheric rough surface is performed and the flexibility of this characterization method is also discussed.

Paper Details

Date Published: 14 November 2007
PDF: 9 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672225 (14 November 2007); doi: 10.1117/12.783126
Show Author Affiliations
Y. F. Peng, Xiamen Univ. (China)
Y. B. Guo, Xiamen Univ. (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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