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Proceedings Paper

Super-resolved imaging system with oversampling technology
Author(s): Xin Zhang; Yanyan Liu; Jian-ping Zhang; Ling-jie Wang
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Paper Abstract

It has been a significant issue in the imaging filed to provide the highest possible resolution of an electro-optical imaging system(E-O imaging system). CCD arrays are inherently undersampled and spatial frequency above Nyquist frequency is distorted so as to create ambiguity and Moire patterns for targets imaged by E-O system.. As to this drawback, a system-design project is introduced and discussed in the paper. It's well known that many image quality metrics are linked to MTF. However, CCDs don't satisfy MTF condition, namely, the shift-invariant property, so MTF synthesis can't appraise the whole system simply by the MTF product of the few sub-system ones in E-O imaging system. Then it is depicted how to solve this problem in the following. Finally the analyses and comparisons of the imaging performance parameters with and without super-resolved technologies are shown.

Paper Details

Date Published: 14 November 2007
PDF: 6 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672214 (14 November 2007); doi: 10.1117/12.782950
Show Author Affiliations
Xin Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yanyan Liu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)
Jian-ping Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)
Ling-jie Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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