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Proceedings Paper

Analysis of infrared interferometry with laser noises
Author(s): Xiangke Cao; Rongzhu Zhang
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Paper Abstract

Based on wave equation of light, with the technique of statistic analysis in signal and system field, an analysis model of semiconductor laser noise has been established. With this model the author analyzes the infrared interferometer used for optical surface test. The disturbance of phase noise acting on the interference field in the precise test process is discussed in detail. Numeric algorithm is employed to calculate the optical field distribution with phase noise propagating through an interferometer system.

Paper Details

Date Published: 27 November 2007
PDF: 5 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67230M (27 November 2007); doi: 10.1117/12.782923
Show Author Affiliations
Xiangke Cao, Sichuan Univ. (China)
Rongzhu Zhang, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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