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Proceedings Paper

Mach-Zehnder interferometer for auto-collimated beams in non-channel photonic crystals
Author(s): Xiaopeng Shen; Kui Han; Yifeng Shen; Xianqing Yang; Gang Tang; Haipeng Li; Ziyu Wang
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Paper Abstract

We propose a auto-collimating Mach-Zehnder interferometer (MZI) for refractive index measurement and optical on/off switch in non-channel photonic crystals (PhCs) by filling the lattice with fluid of different refractive index. The designed MZI, consisting of non-channel waveguides, optical bends and beam splitters for auto-collimated beams, is actively controlled by changing the refractive index of background material in one of its two optical paths. Equi-frequency contour (EFC) analysis and finite-difference time-domain (FDTD) simulations are used to quantify the optical properties of auto-collimation based bends, beam splitters and MZI. Simulation results show that the output intensities exhibit sinusoidal curves as a function of refractive index, and the π− phase shift is obtained as the background refractive index changes as small as Δn=0.16. The novel interferometer demonstrates a great potential to act as a sensitive refractive index sensor or as an intensity modulator in optical circuits.

Paper Details

Date Published: 21 November 2007
PDF: 8 pages
Proc. SPIE 6724, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 67241H (21 November 2007); doi: 10.1117/12.782887
Show Author Affiliations
Xiaopeng Shen, China Univ. of Mining and Technology (China)
Kui Han, China Univ. of Mining and Technology (China)
Yifeng Shen, China Univ. of Mining and Technology (China)
Xianqing Yang, China Univ. of Mining and Technology (China)
Gang Tang, China Univ. of Mining and Technology (China)
Haipeng Li, China Univ. of Mining and Technology (China)
Ziyu Wang, China Univ. of Mining and Technology (China)


Published in SPIE Proceedings Vol. 6724:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Sen Han; Tingwen Xing; Yanqiu Li; Zheng Cui, Editor(s)

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