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Proceedings Paper

Mid-frequency surface error test with a Foucault apparatus
Author(s): Bin Xuan; Junfeng Li; Shumei Song; Jingjiang Xie
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Paper Abstract

Testing of mid-frequency surface error is of the first importance for fast optics, especially for large aperture aspherics. Foucault test plays a dominant role for surface error inspection before the digital interferometer age, but it seems to have faded out these days because no quantitative results turn out. However, an interferometer with high resolution CCDs is either unavailable or unaccessible in the process of manufacture. As its advantages are realized and recognized for the second time, Foucault test is going back to the stage again. A new theory of calculating the contrast of the shadow pattern of Foucault test is put forward in this paper and some modifications are discussed upon the analyses of the limitation of traditional Foucault apparatus. A paraboloidal mirror was fabricated and tested by the modified Foucault apparatus whose effect has been proved to be great. The methods of controlling mid-frequency error are described in the other paper at this conference- "Multi-mode combine manufacturing technology for large aperture aspheric mirrors"1.

Paper Details

Date Published: 17 January 2008
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67230A (17 January 2008); doi: 10.1117/12.782715
Show Author Affiliations
Bin Xuan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)
Junfeng Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)
Shumei Song, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jingjiang Xie, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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