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Proceedings Paper

Edge detection of grain image and algorithm of extra work
Author(s): Yunshan Wang; Bin Qin; Shuchun Si
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Paper Abstract

In order to get continuous and one-point-width of edge line, a method for noise-supprssion in accordance with rough extent of image is presented. After getting the edge lineby way of wavelets transform, a suit of improvements for edge line is established and adopted. Finally, a satisfied result is obtained with piece grain image segmented successfully.

Paper Details

Date Published: 17 January 2008
PDF: 5 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672307 (17 January 2008); doi: 10.1117/12.782694
Show Author Affiliations
Yunshan Wang, Shandong Univ. (China)
Bin Qin, Shandong Univ. (China)
Shuchun Si, Shandong Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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