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Proceedings Paper

19-element sensorless adaptive optical system based on modified hill-climbing and genetic algorithms
Author(s): Ping Yang; Wei Yang; Yuan Liu; Shijie Hu; Mingwu Ao; Bin Xu; Wenham Jiang
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Paper Abstract

A conventional adaptive optical system (AOS) often measures the wavefront slope or curvature straightly by a wavefront sensor. However, another alternative approach allows the design of an AOS without an independent wavefront sensor. This technique detect the image quality affected by phase aberration in laser wavefront rather than measuring the phase aberration itself, and then the image quality is taken as a sharpness metric. When wavefront phase aberration is corrected, the sharpness metric reaches its maximum value. In this paper, a wavefront sensorless adaptive optical system (AOS) has been set up. This system mainly consists of a 19-element piezoelectricity deformable mirror (DM), a high voltage amplifier, a set of 650nm laser, a CCD camera and an industrial computer. The CCD camera is used to measure the light intensity within an aperture of the focus plane, and then this intensity is regarded as the sharpness metric to optimize. A Modified Hill Climbing Algorithm (MHC) and a Genetic Algorithm (GA) are used to control the DM to correct the phase aberrations in this system. Experimental results show that both of these two algorithms can be used successfully in this indirect wavefront measurement AOS. However, the GA can obtain better performance than the MHC. After phase aberrations are corrected, the βfactor are reduced from 5.5 to 1.5 and 1.9, from 30 to 1.2 and 1.4 respectively.

Paper Details

Date Published: 21 November 2007
PDF: 7 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672303 (21 November 2007); doi: 10.1117/12.782681
Show Author Affiliations
Ping Yang, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Wei Yang, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Yuan Liu, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Shijie Hu, Institute of Optics and Electronics (China)
Mingwu Ao, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Bin Xu, Institute of Optics and Electronics (China)
Wenham Jiang, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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