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Proceedings Paper

Method for 3D profilometry measurement based on contouring moire fringe
Author(s): Zhiwei Shi; Juhua Lin
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Paper Abstract

3D shape measurement is one of the most active branches of optical research recently. A method of 3D profilometry measurement by the combination of Moire projection method and phase-shifting technology based on SCM (Single Chip Microcomputer) control is presented in the paper. Automatic measurement of 3D surface profiles can be carried out by applying this method with high speed and high precision.

Paper Details

Date Published: 26 November 2007
PDF: 5 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672302 (26 November 2007); doi: 10.1117/12.782675
Show Author Affiliations
Zhiwei Shi, Guangdong Univ. of Technology (China)
Juhua Lin, Guangdong Univ. of Technology (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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