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Proceedings Paper

Multicolor quantum dots-in-a-well focal plane arrays
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Paper Abstract

This paper discusses recent and future advancements in the field of quantum dots-in-a-well (DWELL) focal plane arrays (FPAs). Additionally, for clarity sake, the fundamentals of FPA figures of merit are reviewed. The DWELL detector represents a hybrid between a conventional quantum well photodetector (QWIP) and a quantum dot (QD) photodetector (QDIP). This hybridization, where the active region consists of QDs embedded in a quantum well (QW), grants DWELLs many of the advantages of its components. This includes normally incident photon sensitivity without gratings or optocoupers, like QDIPs, and reproducible control over operating wavelength through 'dial-in recipes' as seen in QWIPs. Conclusions, drawn by the long carrier lifetimes observed in DWELL heterostructures using femtosecond spectroscopy, have recently backed up by reports of high temperature operation results for DWELL FPAs. This paper will conclude with a preview of some upcoming advances in the field of DWELL focal plane arrays.

Paper Details

Date Published: 2 May 2008
PDF: 12 pages
Proc. SPIE 6940, Infrared Technology and Applications XXXIV, 694003 (2 May 2008); doi: 10.1117/12.782123
Show Author Affiliations
Thomas E. Vandervelde, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Michael C. Lenz, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Eric Varley, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Ajit Barve, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Jiayi Shao, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Rajeev Shenoi, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
David A. Ramirez, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Wooyong Jang, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Yagya D. Sharma, Ctr. for High Technology Materials, Univ. of New Mexico (United States)
Sanjay Krishna, Ctr. for High Technology Materials, Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 6940:
Infrared Technology and Applications XXXIV
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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