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Proceedings Paper

Third generation infrared system calibration using dual band thermoelectric thermal reference sources and test systems to calibrate uncooled IRFPAs
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Paper Abstract

As dual band, 3rd generation FLIR systems progress from the research lab into the field, supporting technologies must also advance. This paper describes advances in Thermoelectric Thermal Reference Sources (TTRS) from single band (3 to 5 or 8 to 12 microns) to dual band in one assembly (3 to 5 and 8 to 12 microns). It will describe the optical, system, electrical, and mechanical parameters of dual band TTRS units. It provides IR system design engineers with the critical parameters of dual band TTRS units to aid in their design process. TTRS assemblies provide a temperature controllable radiometrically uniform surface. When viewed by theFLIR system detectors, the TTRS enables the system electronics to perform gain and offset calibration as well as DC restoration for each pixel's preamp Some of the parameters for 3rd Generation FLIR system TTRS units included in this paper will be: Emissivity of BB surfaces. Apparent thermal radiometric uniformity. How this is predicted and measured. Window material wavelength transmission (Hermetically sealed units only). TTRS emitter surface temperatures as a function of heat sink temperatures. Trade-off between uniformity, power consumption, and transient performance. Power consumption, Thermal interfaces and required heat sinking Types and accuracy of Temperature sensors mounted on emitter surface. Also included in this paper is a description of a Thermoelectric Black Body Test Apparatus that can be used to generate temperature coefficients needed to "burn" Proms for uncooled IRFPAs during their production and burn in processing.

Paper Details

Date Published: 15 April 2008
PDF: 12 pages
Proc. SPIE 6940, Infrared Technology and Applications XXXIV, 69400V (15 April 2008); doi: 10.1117/12.782057
Show Author Affiliations
David K. Finfrock, Marlow Industries, Inc. (United States)
William L. Kolander, Marlow Industries, Inc. (United States)


Published in SPIE Proceedings Vol. 6940:
Infrared Technology and Applications XXXIV
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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