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Proceedings Paper

Design of a synthetic vision overlay for UAV autoland monitoring
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Paper Abstract

For Unmanned Aerial Vehicles (UAVs), autonomous forms of autoland are being pursued that do not depend on special, deployability restraining, ground-based equipment for the generation of the reference path to the runway. Typically, these forms of autoland use runway location data from an onboard database to generate the reference path to the desired location. Synthetic Vision (SV) technology provides the opportunity to use conformally integrated guidance reference data to 'anchor' the goals of such an autoland system into the imagery of the nose-mounted camera. A potential use of this is to support the operator in determining whether the vehicle is flying towards the right location in the real world, e.g., the desired touchdown position on the runway. Standard conformally integrated symbology, representing e.g., the future pathway and runway boundaries, supports conformance monitoring and detection of latent positioning errors. Additional integration of landing performance criteria into the symbology supports assessment of the severity of these errors, further aiding the operator in the decision whether the automated landing should be allowed to continue or not. This paper presents the design and implementation of an SV overlay for UAV autoland procedures that is intended for conformance and integrity monitoring during final approach. It provides preview of mode changes and decision points and it supports the operator in assessing the integrity of the used guidance solution.

Paper Details

Date Published: 15 April 2008
PDF: 11 pages
Proc. SPIE 6957, Enhanced and Synthetic Vision 2008, 69570B (15 April 2008); doi: 10.1117/12.781845
Show Author Affiliations
Jochum Tadema, Netherlands Defence Academy (Netherlands)
Eric Theunissen, Netherlands Defence Academy (Netherlands)
Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 6957:
Enhanced and Synthetic Vision 2008
Jeff J. Güell; Maarten Uijt de Haag, Editor(s)

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