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Proceedings Paper

Sensitivity increase in digital holographic interferometry
Author(s): Nazif Demoli; Kristina Šariri; Ivica Sović; Marc Torzynski; Hanan Halaq; Dalibor Vukičević
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Paper Abstract

When using the interferometric techniques, the optical path changes induce the wavefront deformations that in turn cause the appearance of fringes. One general characteristic of such an approach is the measurement sensitivity. The actual sensitivity of a holographic interferometer is a function of, on one hand, the parameters of the measuring system (such as the wavelength of the light used) and, on the other hand, the environmental conditions in which the measurements are being made. The later depend predominately on statistical fluctuations inherent to the particular laboratory conditions. In many applications the sensitivity is near the limits of the deformation detectability. In such cases, it is of vital interest to increase the number of interferometric fringes thus improving the quality of the acquired data. In this paper, we give an overview of the sensitivity increase through various experimental and numerical approaches. We also present a new numerical iterative method in which every cycle doubles the number of interferometric fringes. The method has shown to be especially useful in applications with sub-wavelength wavefront deformations.

Paper Details

Date Published: 25 April 2008
PDF: 11 pages
Proc. SPIE 6995, Optical Micro- and Nanometrology in Microsystems Technology II, 699502 (25 April 2008); doi: 10.1117/12.781532
Show Author Affiliations
Nazif Demoli, Institute of Physics (Croatia)
Kristina Šariri, Institute of Physics (Croatia)
Ivica Sović, Univ. of Zagreb (Croatia)
Marc Torzynski, Univ. Louis Pasteur (France)
Hanan Halaq, Univ. Louis Pasteur (France)
Dalibor Vukičević, Univ. Louis Pasteur (France)

Published in SPIE Proceedings Vol. 6995:
Optical Micro- and Nanometrology in Microsystems Technology II
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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