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Proceedings Paper

Accurate three-dimensional detection of micro-particles by means of digital holographic microscopy
Author(s): Maciej Antkowiak; Natacha Callens; Cédric Schockaert; Catherine Yourassowsky; Frank Dubois
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Paper Abstract

We present a numerical technique for refocusing and three-dimensional localization of micron-size particles observed in a digital holographic microscope working in transmission. We use Fourier method for the extraction of complex amplitude from the single exposition digital holograms. The three dimensional localization of objects is performed using the focus plane determination method based on the integrated amplitude modulus. We apply the refocusing criterion locally for each pixel, using small overlapping windows, in order to obtain a synthetic image in which all objects are refocused independent from their refocusing distance. We perform image segmentation and object detection using both the synthetic refocused image and the value of refocusing criterion, which allows us to obtain a high detection efficiency with very low number of false detections. While the lateral precision of localization is determined by the optical resolution of the setup, the vertical accuracy depends on the parameters of the digital holographic reconstruction. We improve the accuracy of vertical localization using an additional refining procedure in which each particle is treated separately. We analyze the robustness and accuracy of our approach and present its successful implementation in particle flow experiments.

Paper Details

Date Published: 25 April 2008
PDF: 12 pages
Proc. SPIE 6995, Optical Micro- and Nanometrology in Microsystems Technology II, 699514 (25 April 2008); doi: 10.1117/12.781210
Show Author Affiliations
Maciej Antkowiak, Univ. Libre de Bruxelles (Belgium)
Natacha Callens, Univ. Libre de Bruxelles (Belgium)
Cédric Schockaert, Univ. Libre de Bruxelles (Belgium)
Catherine Yourassowsky, Univ. Libre de Bruxelles (Belgium)
Frank Dubois, Univ. Libre de Bruxelles (Belgium)


Published in SPIE Proceedings Vol. 6995:
Optical Micro- and Nanometrology in Microsystems Technology II
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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