Share Email Print
cover

Proceedings Paper

Electro-optical properties of BaTiO3-SrTiO3 multilayer thin films for waveguide modulators
Author(s): Jussi Hiltunen; Mikko Karppinen; Pentti Karioja; Jyrki Lappalainen; Jarkko Puustinen; Vilho Lantto; Harry L. Tuller
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical properties of ferroelectric BaTiO3 (BTO) and paraelectric SrTiO3 (STO) multilayer structures were investigated as a possible material choice for thin-film electro-optic devices. It has been demonstrated that dielectric properties can be enhanced by optimizing the stacking periodicity of BTO-STO superlattices, and in this work, it was studied how the shifts in permittivity are transferred to the optical properties. BTO-STO superlattices with stacking periodicity varying between 27 Å and 1670 Å were grown on MgO substrates by pulsed laser deposition. In x-ray diffraction patterns, periodic satellite peaks were observed indicating the formation artificial superlattices. The evolution of electro-optic response with varying stacking periodicity was analyzed by ellipsometric transmission method. The electro-optic response reached a maximum at a stacking periodicity of 105 Å corresponding the individual layer thickness of 13 unit cells. The suitability of superlattices, and also single layer BTO thin films, in planar optical devices were evaluated by fabricating and characterizing Mach - Zehnder waveguide modulators.

Paper Details

Date Published: 1 May 2008
PDF: 8 pages
Proc. SPIE 6996, Silicon Photonics and Photonic Integrated Circuits, 69960H (1 May 2008); doi: 10.1117/12.781163
Show Author Affiliations
Jussi Hiltunen, VTT Technical Research Ctr. of Finland (Finland)
Mikko Karppinen, VTT Technical Research Ctr. of Finland (Finland)
Pentti Karioja, VTT Technical Research Ctr. of Finland (Finland)
Jyrki Lappalainen, Univ. of Oulu (Finland)
Jarkko Puustinen, Univ. of Oulu (Finland)
Vilho Lantto, Univ. of Oulu (Finland)
Harry L. Tuller, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6996:
Silicon Photonics and Photonic Integrated Circuits
Giancarlo C. Righini; Seppo K. Honkanen; Lorenzo Pavesi; Laurent Vivien, Editor(s)

© SPIE. Terms of Use
Back to Top