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Proceedings Paper

Calibration of full-waveform airborne laser scanning data for object classification
Author(s): Christian Briese; Bernhard Höfle; Hubert Lehner; Wolfgang Wagner; Martin Pfennigbauer; Andreas Ullrich
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Paper Abstract

Small-footprint airborne laser scanners with waveform-digitizing capabilities are becoming increasingly available. Waveform-digitizing laser scanners seize the physical measurement process in its entire complexity. This leads the way to the possibility of deriving the backscatter cross section which is a measure of the electromagnetic energy intercepted and reradiated by objects. The cross section can be obtained by firstly decomposing the echo waveform in several distinct echoes, whereas for each echo its range, amplitude and width are known. Then the radar equation can be used for calibrating the waveform measurements using external reference targets with known backscatter cross sections. The final outcome is a 3D point cloud where each point represents one scatterer with a given cross section and echo width. Using these physical attributes and various geometric criteria the point cloud can be segmented or classified. In this paper this procedure is demonstrated based on waveform measurements acquired by the RIEGL LMS-Q560 sensor. The cross section of the homogenous reference targets is estimated with a RIEGL reflectometer and Spectralon® targets.

Paper Details

Date Published: 16 April 2008
PDF: 8 pages
Proc. SPIE 6950, Laser Radar Technology and Applications XIII, 69500H (16 April 2008); doi: 10.1117/12.781086
Show Author Affiliations
Christian Briese, Vienna Univ. of Technology (Austria)
Bernhard Höfle, Vienna Univ. of Technology (Austria)
Hubert Lehner, Vienna Univ. of Technology (Austria)
Wolfgang Wagner, Vienna Univ. of Technology (Austria)
Martin Pfennigbauer, RIEGL Laser Measurement Systems GmbH (Austria)
Andreas Ullrich, RIEGL Laser Measurement Systems GmbH (Austria)


Published in SPIE Proceedings Vol. 6950:
Laser Radar Technology and Applications XIII
Monte D. Turner; Gary W. Kamerman, Editor(s)

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