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Proceedings Paper

Automated inspection of microlens arrays
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Paper Abstract

Industrial inspection of micro-devices is often a very challenging task, especially when those devices are produced in large quantities using micro-fabrication techniques. In the case of microlenses, millions of lenses are produced on the same substrate, thus forming a dense array. In this article, we investigate a possible automation of the microlens array inspection process. First, two image processing methods are considered and compared: reference subtraction and blob analysis. The criteria chosen to compare them are the reliability of the defect detection, the processing time required, as well as the sensitivity to image acquisition conditions, such as varying illumination and focus. Tests performed on a real-world database of microlens array images led to select the blob analysis method. Based on the selected method, an automated inspection software module was then successfully implemented. Its good performance allows to dramatically reduce the inspection time as well as the human intervention in the inspection process.

Paper Details

Date Published: 25 April 2008
PDF: 9 pages
Proc. SPIE 7000, Optical and Digital Image Processing, 700008 (25 April 2008); doi: 10.1117/12.781015
Show Author Affiliations
James Mure-Dubois, Univ. of Neuchâtel (Switzerland)
Heinz Hügli, Univ. of Neuchâtel (Switzerland)

Published in SPIE Proceedings Vol. 7000:
Optical and Digital Image Processing
Peter Schelkens; Touradj Ebrahimi; Gabriel Cristóbal; Frédéric Truchetet, Editor(s)

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