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Proceedings Paper

Hollow waveguides ray-tracing analysis
Author(s): David Izquierdo; Iñigo Salinas; Victor Cadarso; Andreu Llobera; Juan Ignacio Garcés
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Paper Abstract

A ray tracing simulation method for integrated optics hollow waveguides has been developed. This method has been tested on Silicon waveguides with good results, providing a suitable design tool for new devices using this type of waveguides. The simulations allow the design of new guiding structures based on hollow waveguides, like input tapers to reduce the insertion losses. The study of the hollow waveguide behavior with different refractive indices opens the way for their use as refractive index sensors.

Paper Details

Date Published: 14 May 2008
PDF: 8 pages
Proc. SPIE 6992, Micro-Optics 2008, 699216 (14 May 2008); doi: 10.1117/12.780989
Show Author Affiliations
David Izquierdo, Univ. de Zaragoza (Spain)
Iñigo Salinas, Univ. de Zaragoza (Spain)
Victor Cadarso, Ctr. Nacional de Microelectrónica (Spain)
Andreu Llobera, Ctr. Nacional de Microelectrónica (Spain)
Juan Ignacio Garcés, Univ. de Zaragoza (Spain)

Published in SPIE Proceedings Vol. 6992:
Micro-Optics 2008
Hugo Thienpont; Peter Van Daele; Jürgen Mohr; Mohammad R. Taghizadeh, Editor(s)

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