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Proceedings Paper

Measuring near-field optical distributions emitted from chip surface of photonic crystal patterned light emitting diodes
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Paper Abstract

In our study, the distribution of the near-field close to the chip surface of Photonic Crystal (PhC)-patterned GaN-based blue LED is measured with Near-field Scanning Optical Microscopy (NSOM). The blue LED has the layer structure consisted of Sapphire substrate - n-GaN - Multi Quantum Well (MQW) - p-GaN - ITO, where the PhC pattern is incorporated onto the top p-GaN layer. When the current is applied to the MQW, the light is emitted out of LED and the near-field on the surface of LED chip is picked up by the fiber probe of NSOM system. The system was made by ourselves, and the distance between the probe and the surface is controlled by shear force feedback control method using tuning fork, where lock-in amplifier was used for noise reduction and for dithering the probe.

Paper Details

Date Published: 23 April 2008
PDF: 11 pages
Proc. SPIE 6988, Nanophotonics II, 69880P (23 April 2008); doi: 10.1117/12.780816
Show Author Affiliations
Kyoung-Duck Park, Inha Univ. (South Korea)
Won-Soo Ji, Samsung Electro-Mechanics Co. Ltd. (South Korea)
Dae-Seo Park, Inha Univ. (South Korea)
Dae-Chan Kim, Inha Univ. (South Korea)
Beom-Hoan O, Inha Univ. (South Korea)
Se-Geun Park, Inha Univ. (South Korea)
El-Hang Lee, Inha Univ. (South Korea)
Seung Gol Lee, Inha Univ. (South Korea)

Published in SPIE Proceedings Vol. 6988:
Nanophotonics II
David L. Andrews; Jean-Michel Nunzi; Andreas Ostendorf, Editor(s)

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