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Proceedings Paper

Double-negative metamaterial optical waveguide behavior subjected to stress
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Paper Abstract

Stress effect on the behavior of optical waveguide sensor consists of dielectric slab inserted between metamaterial (MTM) cladding and substrate is investigated by using numerical calculations. Several MTMs with different values of ε and μ with ε μ = 4 are chosen in order to clarify the variation of stress effect with respect to the material constants. Numerical calculations of the effective index for both transverse electric modes (TE) and transverse magnetic modes (TM) as a function of stress and slab thickness have been performed. It is found that stress affects the performance of the waveguide sensor.

Paper Details

Date Published: 6 May 2008
PDF: 8 pages
Proc. SPIE 6987, Metamaterials III, 69871W (6 May 2008); doi: 10.1117/12.780734
Show Author Affiliations
H. J. El-Khozondar, Islamic Univ. of Gaza (Palestinian Territory (Occupied))
R. J. El-Khozondar, Al-Aqsa Univ. (Palestinian Territory (Occupied))
M. M. Shabat, Islamic Univ. of Gaza (Palestinian Territory (Occupied))


Published in SPIE Proceedings Vol. 6987:
Metamaterials III
Nigel P. Johnson; Ekmel Özbay; Nikolay I. Zheludev; Richard W. Ziolkowski, Editor(s)

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