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Proceedings Paper

Optical characterization of periodically poled KTP
Author(s): W. H. Peeters; M. P. van Exter
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Paper Abstract

We demonstrate and compare three different experimental techniques to characterize the quality of periodically poled crystals. All techniques are based on the observation and analysis of Maker fringes in either spontaneous parametric down-conversion (SPDC) or second harmonic generation (SHG). For perfectly-poled crystals these Maker fringes are expected to have a sinc2-shape. We show how the observed deviations from this ideal shape can be used to characterize the quality of the poling structure and analyze them with a new Fourier method, which distinguished between variations in the poling composition and poling period.

Paper Details

Date Published: 23 April 2008
PDF: 12 pages
Proc. SPIE 6988, Nanophotonics II, 69880E (23 April 2008); doi: 10.1117/12.780592
Show Author Affiliations
W. H. Peeters, Huygens Lab., Leiden Univ. (Netherlands)
M. P. van Exter, Huygens Lab., Leiden Univ. (Netherlands)

Published in SPIE Proceedings Vol. 6988:
Nanophotonics II
David L. Andrews; Jean-Michel Nunzi; Andreas Ostendorf, Editor(s)

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