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Proceedings Paper

Advanced optical characterization of broad-band light-emitting color-center strip waveguides in lithium fluoride
Author(s): Rosa Maria Montereali; Francesca Bonfigli; Marco Montecchi; Enrico Nichelatti; Massimo Piccinini
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Paper Abstract

Broad-band light-emitting color-center active waveguides induced at the surface of Lithium Fluoride, LiF, crystals by direct writing with low-energy electron beams show great potentialities for the realization of innovative miniaturized solid-state light sources, optical amplifiers and lasers operating in the green-red wavelength interval under optical pumping in the blue spectral range. Their full spectral characterization, hence the optimization of LiF-based single-mode active waveguides, still remains a difficult task. Color-center micro-strip waveguides induced by electron-beam lithography in LiF crystals were successfully characterized via fluorescence imaging microscopy and optical transmittance measurements performed in a versatile spectrophotometer that can measure the transmittance through microstructures down to dimensions of about 50 μm. The irradiation gave rise to the stable formation of primary and aggregate color centers within a thin surface layer of the crystal, whose refractive index is locally modified with respect to the surrounding blank material. The electronic defect volume concentrations and the wavelength-dependent refractive index modifications were evaluated as functions of the irradiation dose for three active micro-strips produced by 12 keV electrons on the same LiF crystal.

Paper Details

Date Published: 1 May 2008
PDF: 9 pages
Proc. SPIE 6996, Silicon Photonics and Photonic Integrated Circuits, 69960J (1 May 2008); doi: 10.1117/12.780571
Show Author Affiliations
Rosa Maria Montereali, ENEA (Italy)
Francesca Bonfigli, ENEA (Italy)
Marco Montecchi, ENEA (Italy)
Enrico Nichelatti, ENEA (Italy)
Massimo Piccinini, INFN-LNF (Italy)

Published in SPIE Proceedings Vol. 6996:
Silicon Photonics and Photonic Integrated Circuits
Giancarlo C. Righini; Seppo K. Honkanen; Lorenzo Pavesi; Laurent Vivien, Editor(s)

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