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Proceedings Paper

Polarization bistability in 1.5 micron wavelength single-mode vertical-cavity surface-emitting lasers induced by orthogonal optical injection
Author(s): A. Valle; M. Gómez-Molina; L. Pesquera
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Paper Abstract

We study experimentally the polarization bistability of a single transverse and polarization mode vertical-cavity surface-emitting laser (VCSEL) induced by orthogonal optical injection. As the master laser frequency is scanned near the resonance frequency of the depressed linearly polarized fundamental-mode, and for a fixed master laser power, the VCSEL exhibits two successive polarization switchings. Pure frequency-induced polarization bistability is found because both polarization switchings exhibit bistable regions. The width of both bistable regions is analyzed as a function of the master laser power and for different values of the VCSEL current. The hysteresis width fluctuates around a constant level while the injected power is smaller than a certain value. Further increase of the master laser power leads to a smaller constant value of the hysteresis width. The value of that transition value is independent on the VCSEL current. Power-induced polarization bistability - by fixing the frequency of the injected light- is found near that transition value. The character of the power-hysteresis cycles change from clockwise to anticlockwise as the master laser frequency moves away from the frequency of the depressed linearly polarized fundamental-mode. Qualitatively similar results are found for different VCSELs with wavelength around 1550 nm.

Paper Details

Date Published: 8 May 2008
PDF: 12 pages
Proc. SPIE 6997, Semiconductor Lasers and Laser Dynamics III, 69971J (8 May 2008); doi: 10.1117/12.780470
Show Author Affiliations
A. Valle, Univ. de Cantabria (Spain)
M. Gómez-Molina, Univ. de Cantabria (Spain)
L. Pesquera, Univ. de Cantabria (Spain)


Published in SPIE Proceedings Vol. 6997:
Semiconductor Lasers and Laser Dynamics III
Krassimir P. Panajotov; Marc Sciamanna; Angel A. Valle; Rainer Michalzik, Editor(s)

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