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Proceedings Paper

Image capture and processing for a microoptical compound-eye sensor
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Paper Abstract

An artificial compound-eye imaging system has been developed consisting of one planar array of microlenses positioned on a spacing structure and coupled to a commercial CMOS optoelectronic detector array of different pitch, providing different viewing directions for the individual optical channels. Each microlens corresponds to one channel, which can be related to one or more pixels due to the different fill factors of the microlens array and the image sensor. Also alignment problems resulting from the matching of the microlens focal spots and the pixels during the assembly and the possible residual rotation between the artificial compound-eye objective and the pixel matrix are considered. We have written a program to automatically select the illuminated pixels of the sensor which correspond to each channel in order to form the final image. This calibration method is based on intensity criterions besides the geometric disposition of the microlens array. An image capture program that uses only the channels selected by the calibration is also presented. This program additionally implements image post-processing methods adapted to the microoptical compound-eye sensor. They are applied to the captured images in real time and allow increasing the contrast of the captured images. One of the methods used is the Wiener filter that is computed by taking into account an approximation of the multichannel imaging process of microoptical compound-eye sensors. Experimental results are presented, which show a noticeable increase in the frequency response when the Wiener filter is used, partially compensating the characteristic low spatial resolution of the artificial compound eyes.

Paper Details

Date Published: 25 April 2008
PDF: 10 pages
Proc. SPIE 7000, Optical and Digital Image Processing, 700019 (25 April 2008); doi: 10.1117/12.779954
Show Author Affiliations
Raúl Tudela, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Andreas Brückner, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Jacques Duparré, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Andreas Bräuer, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)


Published in SPIE Proceedings Vol. 7000:
Optical and Digital Image Processing
Peter Schelkens; Touradj Ebrahimi; Gabriel Cristóbal; Frédéric Truchetet, Editor(s)

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