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Proceedings Paper

Reliability analysis of electric breakdown for piezoelectric ceramic
Author(s): Binsheng Wang; Weiguang An
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Paper Abstract

The reliability of piezoelectric ceramic multilayer actuators has become more important issue for the extension of their use. The viability of lead zirconate titanate (PZT) as a storage dielectric or a brittle material for the applications is critical, representing a significant challenge for piezoelectric ceramic materials. The multilayer actuators, such as co-fired stacks, are now being produced with very small physical dimensions; on the other hand, very high voltages are often used to achieve maximum displacement and/or blocking force. The electrical/mechanical failure of the materials, such as electrical breakdown and cracking failure, are of major concerns in the performance and reliability of piezoelectric ceramic devices. In this work, we introduced the electric breakdown aspects of PZT piezoelectric ceramic, the avalanche mechanism and the statistics analysis method of the weak point breakdown theory briefly, and following the method given by J. F. Scott (1995) and assuming a Maxwell-Boltzmann distribution of defects produces dendritic microshorts, presented the relation of breakdown field and volume of PZT materials, the numerical results showed that calculated values were in good agreement with experimental values. On the basis of analysis above, we gave the limit state equation of electric breakdown field and the process of reliability analysis. Finally, verified this approach by a numerical example.

Paper Details

Date Published: 1 November 2007
PDF: 8 pages
Proc. SPIE 6423, International Conference on Smart Materials and Nanotechnology in Engineering, 642343 (1 November 2007); doi: 10.1117/12.779656
Show Author Affiliations
Binsheng Wang, Harbin Engineering Univ. (China)
Weiguang An, Harbin Engineering Univ. (China)

Published in SPIE Proceedings Vol. 6423:
International Conference on Smart Materials and Nanotechnology in Engineering
Shanyi Du; Jinsong Leng; Anand K. Asundi, Editor(s)

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