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Proceedings Paper

Automated detection of EOS-ESD in electronic circuits using a polarization modulation sensing system
Author(s): Niels Jacksen; James Karins; Tom Odom; Steve Hampton; John Slawenski; Randy Cox; William Robinson
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Paper Abstract

A new detection system has been designed and constructed that enables remote sensing, recording and archiving of Electrical Over-Stress (EOS) and Electro Static Discharge (ESD) events, a major cause of electronic device failure in ruggedized military applications. Advances have been made in the design and manufacture of magneto-optic static event detection devices and in the ability to perform automatic detection of polarization states of the devices. The combined automatic reader and next-generation device are providing viable prototypes for insertion into legacy circuit boards for EOS and ESD monitoring.

Paper Details

Date Published: 2 April 2008
PDF: 9 pages
Proc. SPIE 6972, Polarization: Measurement, Analysis, and Remote Sensing VIII, 697207 (2 April 2008); doi: 10.1117/12.777828
Show Author Affiliations
Niels Jacksen, VCD Technologies (United States)
Pukoa Scientific (United States)
James Karins, Pukoa Scientific (United States)
Tom Odom, VCD Technologies (United States)
Steve Hampton, VCD Technologies (United States)
John Slawenski, VCD Technologies (United States)
Randy Cox, Pukoa Scientific (United States)
William Robinson, Pukoa Scientific (United States)


Published in SPIE Proceedings Vol. 6972:
Polarization: Measurement, Analysis, and Remote Sensing VIII
David B. Chenault; Dennis H. Goldstein, Editor(s)

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