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Proceedings Paper

Rapid passive MMW security screening portal
Author(s): Christopher A. Martin; Carlos Enol García González; Vladimir G. Kolinko; John A. Lovberg
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Paper Abstract

Trex Enterprises Corporation has developed a full body passive millimeter-wave security screening imager. The system images naturally occurring W-band blackbody radiation, which penetrates most types of clothing. When operated indoors, the primary mechanism for image formation is the contrast between body heat radiation and the room temperature radiation emitted or reflected by concealed objects that are opaque at millimeter-wave wavelengths. Trex Enterprises has previously demonstrated that an imager noise level of 0.25 to 0.5 K is necessary to detect and image small concealed threats indoors. Achieving this noise level in a head-to-toe image required image collection times of 24 seconds using the previous imager design. This paper first discusses the measurement of the noise temperature of the MMW detectors employed. The paper then explores reducing the image collection times through a new front-end amplifier design and the addition of more imaging units. By changing the orientation and direction of travel of the imaging units, the new design is able to employ more detectors and collect imagery from a subject's front and sides. The combination of lower noise amplifiers and a new scanning architecture results in an imager appropriate for high throughput security screening scenarios. Imagery from the new configuration is also presented.

Paper Details

Date Published: 18 April 2008
PDF: 9 pages
Proc. SPIE 6948, Passive Millimeter-Wave Imaging Technology XI, 69480J (18 April 2008); doi: 10.1117/12.777306
Show Author Affiliations
Christopher A. Martin, Trex Enterprises Corp. (United States)
Carlos Enol García González, Univ. Complutense de Madrid (Spain)
Vladimir G. Kolinko, Trex Enterprises Corp. (United States)
John A. Lovberg, Trex Enterprises Corp. (United States)


Published in SPIE Proceedings Vol. 6948:
Passive Millimeter-Wave Imaging Technology XI
Roger Appleby; David A. Wikner, Editor(s)

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