Share Email Print
cover

Proceedings Paper

Feature extraction of attributed scattering centers on high resolution SAR imagery
Author(s): Jin Yang; Dong-mei Yan; Chao Wang; Hong Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The attributed scattering center model is based on the solutions from both physical optics and the geometric theory of diffraction. In this paper, the attributed scattering center model and the method of extracting the feature of attributed scattering centers from high resolution SAR image are discussed. The method includes four steps: image segmentation, the selection of the model type, the estimate of initial value and the parameter optimization. Seven parameters of one scattering center can be obtained through the above four steps. Then we can get the parameters of all the scattering centers in the imagery by the recurrence procession. The validity of this method can be proved by the results of simulation.

Paper Details

Date Published: 10 November 2007
PDF: 5 pages
Proc. SPIE 6795, Second International Conference on Space Information Technology, 67951R (10 November 2007); doi: 10.1117/12.773984
Show Author Affiliations
Jin Yang, The Academy of Equipment Command and Technology (China)
Dong-mei Yan, China Remote Sensing Satellite Ground Station (China)
Institute of Automation (China)
Chao Wang, China Remote Sensing Satellite Ground Station (China)
Hong Zhang, China Remote Sensing Satellite Ground Station (China)


Published in SPIE Proceedings Vol. 6795:
Second International Conference on Space Information Technology

© SPIE. Terms of Use
Back to Top