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Proceedings Paper

Chemically amplified fullerene resists for e-beam lithography
Author(s): J. Manyam; F. P. Gibbons; S. Diegoli; M. Manickam; J. A. Preece; R. E. Palmer; A. P. G. Robinson
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Paper Abstract

The minimum lithographic feature size for microelectronic fabrication continues to shrink, and resist properties are beginning to dominate the achievable resolution. There is a strong need for a high resolution, high sensitivity resist for future nodes that is not met by conventional polymeric resists at this time. Molecular resists, such as fullerene derivatives have the potential for lower LWR and improved resolution, but have typically been insufficiently sensitive to irradiation. Here we present a fullerene based three component chemically amplified resist system with high resolution and sensitivity, and wide process latitude. The sensitivity of this resist is between 5 and 10 μC/cm2 at 20 keV for various combinations of post application bake and post exposure bake conditions. Using 30 keV electron beam exposure, sparse patterns with 12 nm resolution were demonstrated, at a line dose of 300 pC/cm, whilst dense patterns with half-pitch 20 nm were achieved at 200 pC/cm. The LWR for the densely patterned resist (measured at 20 nm half pitch) is ~ 4.4 nm, whilst for the 12 nm sparse feature the measured LWR is ~ 2.5 nm. The etch durability is comparable with commercial novolac resists

Paper Details

Date Published: 15 April 2008
PDF: 8 pages
Proc. SPIE 6923, Advances in Resist Materials and Processing Technology XXV, 69230M (15 April 2008); doi: 10.1117/12.772645
Show Author Affiliations
J. Manyam, The Univ. of Birmingham (United Kingdom)
F. P. Gibbons, The Univ. of Birmingham (United Kingdom)
S. Diegoli, The Univ. of Birmingham (United Kingdom)
M. Manickam, The Univ. of Birmingham (United Kingdom)
J. A. Preece, The Univ. of Birmingham (United Kingdom)
R. E. Palmer, The Univ. of Birmingham (United Kingdom)
A. P. G. Robinson, The Univ. of Birmingham (United Kingdom)


Published in SPIE Proceedings Vol. 6923:
Advances in Resist Materials and Processing Technology XXV
Clifford L. Henderson, Editor(s)

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